CLS 324

After participation in this course, a student should be able to understand the theories and mechanics of electron microscopy, prepare specimens for EM observation, align the column and observe specimens with the EM, and produce high quality EM photomicrographs. The use of both the Scanning Electron Microscope (SEM) and the Transmission Electron Microscope (TEM) will be included. At completion of the course, the student will learn appropriate methods for preparing samples for observation in the SEM and TEM, and learn to recognize artifacts of sample preparation.